User manual TEKTRONIX DPO-DSA70KB DATASHEET

[. . . ] While other manufacturers promote standard-specific compliance software, the Tektronix solution provides a comprehensive verification, characterization, debug, and compliance environment. The Tektronix USB 3. 0 test bench includes a real-time oscilloscope (DPO/DSA70000B), an arbitrary waveform generator (AWG7122B), a USB 3. 0 test fixture set, and USB 3. 0 test software (USB-TX or USB3 for transmitter test and USB-RMT for receiver test). 500 kHz 1 MHz 2 MHz 4. 9 MHz 10 MHz 20 MHz 33 MHz 50 MHz 400 ps 200 ps 100 ps 40 ps 40 ps 40 ps 40 ps 40 ps The receiver test is simplified by the USB-RMT Automated Receiver Test Solution for SuperSpeed USB. No longer is it a requirement that the end user be an expert in USB 3. 0. The process of defining test parameters, putting the device into the proper test mode (loopback), measuring errors, showing results after each frequency is executed, and printing the test results is fully automated for the user. [. . . ] The results of the test will also be stored in an Excel . xls file that can be used for further data analysis. Included in the test report are the configuration settings for the test equipment, the static parameters for the test (i. e. RJ, Amplitude, SSC Profile, De-emphasis level), a graphical display of the test results, and a tabular display of the test results. Ellisys Protocol Analyzer Error Detection Testing Beyond Compliance Margin Testing While the CTS requires a Jitter Tolerance Test and specific frequencies and amplitudes, it is often necessary to understand at what point the receiver stops interpreting the incoming data correctly, which determines the margin of the device under test. USB-RMT automates margin testing across a range of SJ frequencies so the user is not required to interface with the software while the test is being executed. The user also has the flexibility to change the SJ amplitude of the compliance test points. For example, a compliance test can be ran with 20% margin by easily changing the amplitude of jitter at each frequency and saving that setup. The setup can be recalled at a later point in time and the test can be run under tighter conditions. Complex SSC Profiles One source of system failures or PHY non-compliance is SSC. With USB-RMT, the user can quickly modify the SSC deviation and/or frequency modulation in order to determine if the SSC is the cause of bit errors. Furthermore, the AWG with SerialXpress can be used to generate complex df/dt profiles in order to fully characterize the receiver's pll. Stress the RX over Various Channel Configurations Using the AWG and USB-RMT enables the stressing of the receiver under various channel and cable conditions. The AWG is uniquely suited to stress the receiver by emulating the channel and USB cable in software. By using S-parameters or allowing ISI to be specified in absolute terms (for example . 3 UI) users can quickly configure a test under multiple different operating conditions without requiring physical hardware channels or USB cables. Another benefit from using software emulation is that variability from mechanical wear or different physical channels and cables is not an issue. Test Report Ellisys Protocol Analyzer Error Detection An alternative to using the scope-based error detection is to use an external USB 3. 0 protocol analyzer. The Ellisys USB Explorer 280 5 Gb/s Error Detector is completely integrated into USB-RMT and reports both 8b/10b character errors and disparity errors while ignoring SKP ordered sets. Test Status Once the test has been properly configured, USB-RMT will automatically set up and configure the test equipment. As the test points are being executed the USB-RMT will update the results dynamically. The results of the tests are shown in a tabular format and a graphical display. The Test Status screenshot above shows a compliance test that has passed all of the required frequencies with the exception of 33 MHz. A supported configuration includes a DPO/DSA70000B Series Digital Serial Analyzer www. tektronix. com 5 Data Sheet (or other supported oscilloscope) equipped with DPOJET (Jitter and Eye Diagram Analysis Tools). USB-TX also includes USB3 Essentials DPOJET Measurements and Setup Library. The following table outlines the key differences between the USB3 and the USB-TX software solutions. USB3 Essentials is included with USB-TX and thus all product features included with USB3 Essentials are also included with USB-TX. Table 1 ­ Key Differences between USB3 Essentials and USB-TX Feature USB3 Essentials USB-TX Automatic measurement selections based on device type, test type, test points, and selected probes Automatic selection of Receiver CTLE filter Automatic selection of Tx Channel Modeling for Software Channel Emulation Complete coverage of USB 3. 0 Normative and Informative Tests (See Table 2) Single-button execution for all selected measurements Comprehensive debug environment allows isolation of spec violations, editing of test limits Detailed or Summary Reports Automatically save test reports and waveforms Re-analyze prerecorded waveforms USB-specific user interface Quickly move between precompliance and debug Automated Tj measurement based on Dj (CP0) and Rj (CP1) Single test report for all measurements X X X X X X Detailed Only X X X Detailed and Summary X X X X X X Required Equipment for USB 3. 0 Testing Show MOI For a complete list of required equipment please visit http://www. tek. com/Measurement/applications/serial_data/usb. html Simple Setup, Test Execution, and Reporting Setup and test execution is simple with the TekExpress software. [. . . ] A USB key dongle with software key enables the selected option set Automated TekExpress USB 3. 0 Receiver Margin and Compliance Test Software. Includes: Latest TekExpress product software DVD kit (P/N 020-2913-xx) and upgrade SW key. Online documentation and printable manual in PDF format are supplied Automated TekExpress USB 3. 0 Receiver Margin and Compliance Test Software. Includes: Latest TekExpress product software DVD kit (P/N 020-2913-xx) and upgrade SW key. [. . . ]